造价通

反馈
取消

热门搜词

造价通

取消 发送 反馈意见

纳米技术中的显微学手册·第1卷目录

2022/07/1684 作者:佚名
导读:1 Confocal Scanning Optical Microscopy and Nanotechnology 1.1 Introduction 1.2 The Confocal Microscope 1.2.1 Principles of Confocal Microscopy 1.2.2 Instrumentation 1.2.3 Techniques for Improving Imag

1 Confocal Scanning Optical Microscopy and Nanotechnology

1.1 Introduction

1.2 The Confocal Microscope

1.2.1 Principles of Confocal Microscopy

1.2.2 Instrumentation

1.2.3 Techniques for Improving Imaging of Nanoscale Materials

1.3 Applications to Nanotechnology

1.3.1 Three Dimensional Systems

1.3.2 Two Dimensional Systems

1.3.3 One Dimensional Systems

1.3.4 Zero Dimensional Systems

1.4 Summary and Future Perspectives

References

2 Scanning Near Field Optical Microscopy in Nanosciences

2.1 Scanning Near Field Optical Microscopy and Nanotechnology

2.2 Basic Concepts

2.3 Instrumentation

2.3.1 Probe Fabrication

2.3.2 Flexibility of Near Field Measurements

2.4 Applications in Nanoscience

2.4.1 Fluorescence Microscopy

2.4.2 Raman Microscopy

2.4.3 Plasmonic and Photonic Nanostructures

2.4.4 Nanolithography

2.4.5 Semiconductors

2.5 Perspectives

References

3 Scanning Tunneling Microscopy

3.1 Basic Principles of Scanning Tunneling Microscopy

3.1.1 Electronic Tunneling

3.1.2 Scanning Tunneling Microscope

3.2 Surface Structure Determination by Scanning Tunneling Microscopy

3.2.1 Semiconductor Surfaces

3.2.2 Metal Surfaces

3.2.3 Insulator Surfaces

3.2.4 Nanotubes and Nanowires

3.2.5 Surface and Subsurface Dynamic Processes

3.3 Scanning Tunneling Spectroscopies

3.3.1 Scanning Tunneling Spectroscopy

3.3.2 Inelastic Tunneling Spectroscopy

3.3.3 Local Work Function Measurement

3.4 STM Based Atomic Manipulation

3.4.1 Manipulation of Single atoms

3.4.2 STM Induced Chemical Reaction at Tip

3.5 Recent Developments

3.5.1 Spin Polarized STM

3.5.2 Ultra Low Temperature STM

3.5.3 Dual Tip STM

3.5.4 Variable Temperature Fast Scanning STM

References

4 Visualization of Nanostructures with Atomic Force Microscopy

4.1 Introductory Remarks

4.2 Basics of Atomic Force Microscopy

4.2.1 Main Principle and Components of Atomic Force Microscope

4.2.2 Operational Modes, Optimization of the Experiment and Image Resolution

4.2.3 Imaging in Various Environments and at Different Temperatures

4.3 Imaging of Macromolecules and Their Self Assemblies

4.3.1 Visualization of Single Polymer Chains

4.3.2 Alkanes, Polyethylene and Fluoroalkanes

4.4 Studies of Heterogeneous Systems

4.4.1 Semicrystalline Polymers

4.4.2 Block Copolymers

4.4.3 Polymer Blends and Nanocomposites

4.5 Concluding Remarks

References

5 Scanning Probe Microscopy for Nanoscale Manipulation and Patterning

5.1 Introduction

5.1.1 Nanoscale Toolbox for Nanotechnologists

……

6 Scanning Thermal and Thermoelectric Microscopy

7 Imaging Secondary Ion Mass Spectrometry

8 Atom Probe Tomography

9 Focused Ion Beam System—a Multifunctional Tool for Nanotechnology

10 Electron Beam Lithography

Index 2100433B

*文章为作者独立观点,不代表造价通立场,除来源是“造价通”外。
关注微信公众号造价通(zjtcn_Largedata),获取建设行业第一手资讯

热门推荐

相关阅读