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有机薄膜的表征内容简介

有机薄膜的表征内容简介

相关领域的教学、研究、技术人员以及研究生和高年级本科生参考书。

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有机薄膜的表征造价信息

  • 市场价
  • 信息价
  • 询价

HDPE薄膜

  • 厚0.5mm
  • 13%
  • 东莞市硕泰实业有限公司
  • 2022-12-07
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HDPE薄膜

  • 厚2mm
  • 13%
  • 东莞市硕泰实业有限公司
  • 2022-12-07
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PE薄膜

  • -
  • 丰利广源
  • 13%
  • 北京丰利广源保温建材有限公司
  • 2022-12-07
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HDPE薄膜

  • 1.5mm
  • 13%
  • 广州市波斯成机电设备有限公司
  • 2022-12-07
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方格薄膜

  • 0.1mm/50×50cm
  • 13%
  • 重庆南方测绘仪器有限公司
  • 2022-12-07
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薄膜

  • 种草用
  • 广东2018年全年信息价
  • 水利工程
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薄膜

  • 种草用
  • 广东2015年全年信息价
  • 水利工程
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薄膜

  • 种草用
  • 广东2019年全年信息价
  • 水利工程
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薄膜

  • 种草用
  • 广东2016年全年信息价
  • 水利工程
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薄膜

  • 种草用,可降解,厚度0.01~0.015mm
  • 广东2021年全年信息价
  • 水利工程
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塑料薄膜

  • 塑料薄膜
  • 1m²
  • 1
  • 不含税费 | 不含运费
  • 2009-05-19
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塑料薄膜

  • 塑料薄膜
  • 1m²
  • 1
  • 不含税费 | 不含运费
  • 2009-05-19
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塑料薄膜

  • 塑料薄膜
  • 1726.15m²
  • 2
  • 中档
  • 含税费 | 含运费
  • 2022-07-04
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塑料薄膜

  • 塑料薄膜
  • 268m2
  • 1
  • 中档
  • 含税费 | 含运费
  • 2016-11-16
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温室薄膜

  • 温室薄膜
  • 95000m²
  • 1
  • 不含税费 | 不含运费
  • 2011-02-15
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有机薄膜的表征图书目录

Preface to the Reissue of the Materials Characterization Series

Preface to Series

Preface to the Reissue of Characterization of Organic Thin Films

Preface

Contributors

PART Ⅰ: PREPARATION AND MATERIALS LANGMUIR—BLODGETT FILMS

1.1 Introduction

1.2 L—B Films ofLong—Chain Compounds

FattyAcids

Amines

Other Long—Chain Compounds

1.3 Cyclic Compounds and Chromophores

1.4 Polymers and Proteins

1.5 Polymerization In Situ

1.6 Alternation Films (Superlattices)

1.7 PotentiaIApplications

SELF—ASSEMBLED MONOIAYERS

2.1 Introduction

2.2 Monolayers of Fatty Acids

2.3 Monolayers of Organosilicon Derivatives

2.4 Monolayers of Alkanethiolates on Metal and Semiconductor Surfaces

2.5 Self—Assembled Monolayers Containing Aromatic Groups

2.6 Conclusions

PARTⅡ: ANALYSIS OF FILM AND SURFACEPROPERTIES

SPECTROSCOPIC ELLIPSOMETRY

3.1 Introduction and Overview

3.2 Theory of Ellipsometry

3.3 Instrumentation

3.4 Determination of Optical Properties

Analysis of Single Eliipsometric Spectra: Direct Inversion Methods

Analysis of Single Ellipsometric Spectra: Least— Squares Regression Analysis Method

Analysis of Multiple Ellipsometric Spectra

3.5 Determination of Thin Film Structure

Thickness Determination for Monolayers

Microstructural Evolution in Thick Film Growth

3.6 Future Prospects

INFRARED SPECTROSCOPYIN THE CHARACTERIZATION OF ORGANIC THIN FILMS

4.1 Introduction

Specific Needs for Characterizing Organic Thin Films

General Prinaples and Capabilities of Infrared Spectroscopy for Surface and Thin Film Analysis

4.2 Quantitative Aspects

Spectroscopiclntensities

Electromagnetic Fields in Thin Film Structures

4.3 The Infrared Spectroscopic Experiment

General Instrumentation

Experimental Modes

Additional Aspects

4.4 Examples of Applications

Self—Assembled Monolayers on Gold by External Reflection

Octadecylsiloxane Monolayers on SiO2 byTransmission

Langmuir—Blodgett Films on Nonmetallic Substrates by External Reflection

RAMAN SPECTROSCOPIC CHARACTERIZATION OF ORGANIC THIN FILMS

5.1 Introduction

5.2 FundamentalsofRaman Spectroscopy

5.3 InstrumentaIConsiderations

5.4 Raman Spectroscopic Approaches for the Characterization ofOrganicThin Films

Integrated OpticaIWaveguide Raman Spectroscopy (IOWRS)

Total Internal Reflection Raman Spectroscopy

Surface Enhanced Raman Scattering

Normal Raman Spectroscopy

Resonance Raman Spectroscopy

Plasmon Surface Polariton Enhanced Raman Spectroscopy

FourierTransform Raman Spectroscopy

Waveguide Surface Coherent Anti—Stokes Raman Spectroscopy(WSCARS)

5.5 Selected Examples of Thin Film Analyses

Raman Spectral Characterization of Langmuir—Blodgett Layers of Arachidate and Stearate Salts

Raman Spectral Characterization of Self—Assembled Monolayers of Alkanethiols on Metals

Surface Enhanced Resonance Raman Spectral Characterization of Langmuir—Blodgett Layers of Phthalocyanines

5.6 Prospects for Raman Spectroscopic Characterization of Thin Films

SURFACE POTENTIAL

6.1 Introduction

6.2 Origins of the Contact Potential Difference and Surface Potential

The Work Function

Contact Potential Difference and Surface Potential

Surface Potential Changes Induced by Adsorbates

6.3 Measurement of Surface Potential

CapacitanceTechniques

Ionizing—ProbeTechnique

6.4 Surface Potentials of OrganicThin Films

Air—Water Interface: Surface Potential of Langmuir Mono— layers

Air—Solidlnterface: Surface Potential of L—B and Related Films

6.5 Conclusions

X—RAY DIFFRACTION

7.1 Introduction

7.2 Basic Principles

7.3 StructureNormalto Film Plane

7.4 Structure Within the Film Plane

7.5 Summary

HIGH RESOLUTION EELS STUDIES OF ORGANIC THIN FILMS AND SURFACES

8.1 Introduction

8.2 TheScatteringMechanism

DipoleScattering

Impact Scattering

Resonance Scattering

8.3 TheSpectrometer

8.4 EELS Versus Other Techniques: Advantages and Disadvantages

8.5 Examples

ResolutionEnhancement

Linearity

Depth Sensitivity

Molecular Orientation

Local Versus Long—Range lnteractions

SurfaceS egregation

8.6 Conclusions

WETTING

9.1 Introduction

9.2 ContactAngles

9.3 Techniques for Contact Angle Measurements

Axisymmetric Drop ShapeAnalysis—Profile (ADSA—P)

Axisymmetric Drop Shape Analysis—Contact Diameter (ADSA—CD)

Capillary Rise Technique

9.4 Phase Rule for Moderately Curved Surface Systems

9.5 Equation of State forInterfacialTensions of Solid— Liquid Systems

9.6 Drop Size Dependence of Contact Angle and Line Tension

9.7 Contact Angles in the Presence ofa Thin Liquid Film

9.8 Effects ofElastic Liquid—Vaporlnterfaces on Wetting

SECONDARY ION MASS SPECTROMETRY AS APPLIED TO THIN ORGANIC AND POLYMERIC FILMS

10.1 Introduction and Background

Overview of the SIMS Method and Experiment

Ion FormationMechanisms

Comparisons to Other Surface Analysis Techniques

The Motivation for Thin Organic Films as Model Systems

10.2 Qualitative Information: Mechanisms ofSecondary Molecularlon Formation

Structure—Ion Formation Relationships

Applications to Self—Assembled Film Chemistry

10.3 The Study ofSampling Depth in the SIMS Experiment

10.4 Quantitationin SIMS

Development of Quantitation Methods

Applicationof Quantitative Schemes to Thin Film Chemistry

10.5 ImagingApplications

10.6 Summary and Prospects

X—RAY PHOTOELECTRON SPECTROSCOPY OF ORGANIC THIN FILMS

11.1 Introduction

11.2 Experimental Considerations

11.3 Binding Energy Shifts

11.4 XPS of Molten Films

11.5 Angular Dependent XPS

11.6 ETOAXPS of Self—Assembled Monolayers

11.7 Conclusions

MOLECUlAR ORIENTATION IN THIN FILMS AS PROBED BY OPTICAL SECOND HARMONIC GENERATION

12.1 Introduction

12.2 Experimental Considerations

12.3 Molecular Nonlinear Polarizabiliry Calculation

12.4 Measurements of the Surface Nonlinear Susceptibility

12.5 Molecular Orientation Calculation

Casel:βzzzonly

Case2:βzxxonly

Case3: βxxz(=βxzx)only

Case4:βzzz and βzxx

Case5: βzxx and βxxz(=βxzx)

12.6 Absolute Molecular Orientation Measurements

12.7 Summary and Conclusions

APPENDIX: TECHNIQUE SUMMARIES

I Auger Electron Spectroscopy(AES)

2 DynamicSecondarylon Mass Spectrometry (DynamicSIMS) 252

3 FourierTransformlnfraredSpectroscopy(FTIR) 253

4 High—Resolution Electron Energy Loss Spectroscopy (HREELS)

5 Low—Energy Electron Diffraction(LEED)

6 Raman Spectroscopy

7 Scanning Electron Microscopy(SEM)

8 Scanning Tunneling Microscopy(STM) and Scanning Force Microscopy (SFM)

9 Static Secondarylon Mass Spectrometry (Static SIMS)

10 Transmission Electron Microscopy(TEM)

11 Variable—Angle Spectroscopic Ellipsometry(VASE)

12 X—Ray Diffraction XRD)

13 X—Ray Fluorescence(XRF)

14 X—Ray Photoelectron Spectroscopy(XPS)

Index 2100433B

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有机薄膜的表征内容简介常见问题

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有机薄膜的表征内容简介文献

Mg/PTFE薄膜制备与性能表征 Mg/PTFE薄膜制备与性能表征

Mg/PTFE薄膜制备与性能表征

格式:pdf

大小:1.1MB

页数: 4页

以镁(Mg)为可燃物质,聚四氟乙烯(PTFE)为氧化剂,利用磁控溅射和真空蒸镀两种方法,制备薄膜烟火器件,研究两种制膜工艺在性能上的差异,并对其附着力、薄膜粒度和燃速进行了测量。结果表明,磁控溅射制得的薄膜附着力为35.88mN,粒度为0.1~0.5μm,燃速为(623.9±12.5)mm.s-1,其主要性能优于真空蒸镀法制得的薄膜。

铜表面复合超疏水薄膜的制备及表征 铜表面复合超疏水薄膜的制备及表征

铜表面复合超疏水薄膜的制备及表征

格式:pdf

大小:1.1MB

页数: 4页

该文利用自组装技术,在HNO3(质量分数6.5%)刻蚀的铜表面制备了(3-巯基丙基)三甲氧基硅烷(MPTS)与正辛基三乙氧基硅烷(OS)的复合纳米薄膜,并通过红外光谱对膜结构进行了分析。通过扫描电子显微镜确定了该复合膜具有纳米-微米级粗糙结构;静态接触角达158.6°,滚动角为3°,表明该膜具有超疏水性能;盐水实验证明该复合膜有效地提高了铜的耐腐蚀能力。

薄膜表征系统主要功能

可测定多层薄膜和基片的折射率、吸收系数和厚度,可全自动、可同时测定透过光谱和反射光谱,入射光角度可从0°到90°连续改变。 2100433B

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全自动薄膜表征分析仪主要功能

主要用于评价薄膜等材料在不同的温度范围下吸附性能的评价工作,可实现PRR\TPO\TPD,静态化学吸附,物理吸附等实验能够提供高质量的比表面、孔隙度和化学吸附等温线数据.。 2100433B

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薄膜表征系统技术指标

光谱分辨率:1nm或2nm (可选);光源:150W 氙弧灯;样品尺寸:10×10mm到200×250mm;层数:至多5层,两个未知参数;薄膜厚度范围:1nm到25um,取决于角度、偏振和波长。

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