选择特殊符号
选择搜索类型
请输入搜索
Preface to the Reissue of the Materials Characterization Series
Preface to Series
Preface to the Reissue of Characterization of Organic Thin Films
Preface
Contributors
PART Ⅰ: PREPARATION AND MATERIALS LANGMUIR—BLODGETT FILMS
1.1 Introduction
1.2 L—B Films ofLong—Chain Compounds
FattyAcids
Amines
Other Long—Chain Compounds
1.3 Cyclic Compounds and Chromophores
1.4 Polymers and Proteins
1.5 Polymerization In Situ
1.6 Alternation Films (Superlattices)
1.7 PotentiaIApplications
SELF—ASSEMBLED MONOIAYERS
2.1 Introduction
2.2 Monolayers of Fatty Acids
2.3 Monolayers of Organosilicon Derivatives
2.4 Monolayers of Alkanethiolates on Metal and Semiconductor Surfaces
2.5 Self—Assembled Monolayers Containing Aromatic Groups
2.6 Conclusions
PARTⅡ: ANALYSIS OF FILM AND SURFACEPROPERTIES
SPECTROSCOPIC ELLIPSOMETRY
3.1 Introduction and Overview
3.2 Theory of Ellipsometry
3.3 Instrumentation
3.4 Determination of Optical Properties
Analysis of Single Eliipsometric Spectra: Direct Inversion Methods
Analysis of Single Ellipsometric Spectra: Least— Squares Regression Analysis Method
Analysis of Multiple Ellipsometric Spectra
3.5 Determination of Thin Film Structure
Thickness Determination for Monolayers
Microstructural Evolution in Thick Film Growth
3.6 Future Prospects
INFRARED SPECTROSCOPYIN THE CHARACTERIZATION OF ORGANIC THIN FILMS
4.1 Introduction
Specific Needs for Characterizing Organic Thin Films
General Prinaples and Capabilities of Infrared Spectroscopy for Surface and Thin Film Analysis
4.2 Quantitative Aspects
Spectroscopiclntensities
Electromagnetic Fields in Thin Film Structures
4.3 The Infrared Spectroscopic Experiment
General Instrumentation
Experimental Modes
Additional Aspects
4.4 Examples of Applications
Self—Assembled Monolayers on Gold by External Reflection
Octadecylsiloxane Monolayers on SiO2 byTransmission
Langmuir—Blodgett Films on Nonmetallic Substrates by External Reflection
RAMAN SPECTROSCOPIC CHARACTERIZATION OF ORGANIC THIN FILMS
5.1 Introduction
5.2 FundamentalsofRaman Spectroscopy
5.3 InstrumentaIConsiderations
5.4 Raman Spectroscopic Approaches for the Characterization ofOrganicThin Films
Integrated OpticaIWaveguide Raman Spectroscopy (IOWRS)
Total Internal Reflection Raman Spectroscopy
Surface Enhanced Raman Scattering
Normal Raman Spectroscopy
Resonance Raman Spectroscopy
Plasmon Surface Polariton Enhanced Raman Spectroscopy
FourierTransform Raman Spectroscopy
Waveguide Surface Coherent Anti—Stokes Raman Spectroscopy(WSCARS)
5.5 Selected Examples of Thin Film Analyses
Raman Spectral Characterization of Langmuir—Blodgett Layers of Arachidate and Stearate Salts
Raman Spectral Characterization of Self—Assembled Monolayers of Alkanethiols on Metals
Surface Enhanced Resonance Raman Spectral Characterization of Langmuir—Blodgett Layers of Phthalocyanines
5.6 Prospects for Raman Spectroscopic Characterization of Thin Films
SURFACE POTENTIAL
6.1 Introduction
6.2 Origins of the Contact Potential Difference and Surface Potential
The Work Function
Contact Potential Difference and Surface Potential
Surface Potential Changes Induced by Adsorbates
6.3 Measurement of Surface Potential
CapacitanceTechniques
Ionizing—ProbeTechnique
6.4 Surface Potentials of OrganicThin Films
Air—Water Interface: Surface Potential of Langmuir Mono— layers
Air—Solidlnterface: Surface Potential of L—B and Related Films
6.5 Conclusions
X—RAY DIFFRACTION
7.1 Introduction
7.2 Basic Principles
7.3 StructureNormalto Film Plane
7.4 Structure Within the Film Plane
7.5 Summary
HIGH RESOLUTION EELS STUDIES OF ORGANIC THIN FILMS AND SURFACES
8.1 Introduction
8.2 TheScatteringMechanism
DipoleScattering
Impact Scattering
Resonance Scattering
8.3 TheSpectrometer
8.4 EELS Versus Other Techniques: Advantages and Disadvantages
8.5 Examples
ResolutionEnhancement
Linearity
Depth Sensitivity
Molecular Orientation
Local Versus Long—Range lnteractions
SurfaceS egregation
8.6 Conclusions
WETTING
9.1 Introduction
9.2 ContactAngles
9.3 Techniques for Contact Angle Measurements
Axisymmetric Drop ShapeAnalysis—Profile (ADSA—P)
Axisymmetric Drop Shape Analysis—Contact Diameter (ADSA—CD)
Capillary Rise Technique
9.4 Phase Rule for Moderately Curved Surface Systems
9.5 Equation of State forInterfacialTensions of Solid— Liquid Systems
9.6 Drop Size Dependence of Contact Angle and Line Tension
9.7 Contact Angles in the Presence ofa Thin Liquid Film
9.8 Effects ofElastic Liquid—Vaporlnterfaces on Wetting
SECONDARY ION MASS SPECTROMETRY AS APPLIED TO THIN ORGANIC AND POLYMERIC FILMS
10.1 Introduction and Background
Overview of the SIMS Method and Experiment
Ion FormationMechanisms
Comparisons to Other Surface Analysis Techniques
The Motivation for Thin Organic Films as Model Systems
10.2 Qualitative Information: Mechanisms ofSecondary Molecularlon Formation
Structure—Ion Formation Relationships
Applications to Self—Assembled Film Chemistry
10.3 The Study ofSampling Depth in the SIMS Experiment
10.4 Quantitationin SIMS
Development of Quantitation Methods
Applicationof Quantitative Schemes to Thin Film Chemistry
10.5 ImagingApplications
10.6 Summary and Prospects
X—RAY PHOTOELECTRON SPECTROSCOPY OF ORGANIC THIN FILMS
11.1 Introduction
11.2 Experimental Considerations
11.3 Binding Energy Shifts
11.4 XPS of Molten Films
11.5 Angular Dependent XPS
11.6 ETOAXPS of Self—Assembled Monolayers
11.7 Conclusions
MOLECUlAR ORIENTATION IN THIN FILMS AS PROBED BY OPTICAL SECOND HARMONIC GENERATION
12.1 Introduction
12.2 Experimental Considerations
12.3 Molecular Nonlinear Polarizabiliry Calculation
12.4 Measurements of the Surface Nonlinear Susceptibility
12.5 Molecular Orientation Calculation
Casel:βzzzonly
Case2:βzxxonly
Case3: βxxz(=βxzx)only
Case4:βzzz and βzxx
Case5: βzxx and βxxz(=βxzx)
12.6 Absolute Molecular Orientation Measurements
12.7 Summary and Conclusions
APPENDIX: TECHNIQUE SUMMARIES
I Auger Electron Spectroscopy(AES)
2 DynamicSecondarylon Mass Spectrometry (DynamicSIMS) 252
3 FourierTransformlnfraredSpectroscopy(FTIR) 253
4 High—Resolution Electron Energy Loss Spectroscopy (HREELS)
5 Low—Energy Electron Diffraction(LEED)
6 Raman Spectroscopy
7 Scanning Electron Microscopy(SEM)
8 Scanning Tunneling Microscopy(STM) and Scanning Force Microscopy (SFM)
9 Static Secondarylon Mass Spectrometry (Static SIMS)
10 Transmission Electron Microscopy(TEM)
11 Variable—Angle Spectroscopic Ellipsometry(VASE)
12 X—Ray Diffraction XRD)
13 X—Ray Fluorescence(XRF)
14 X—Ray Photoelectron Spectroscopy(XPS)
Index 2100433B
相关领域的教学、研究、技术人员以及研究生和高年级本科生参考书。
第2版前言第1版前言第1章 土方工程1.1 土的分类与工程性质1.2 场地平整、土方量计算与土方调配1.3 基坑土方开挖准备与降排水1.4 基坑边坡与坑壁支护1.5 土方工程的机械化施工复习思考题第2...
第一篇 综合篇第一章 绿色建筑的理念与实践第二章 绿色建筑评价标识总体情况第三章 发挥“资源”优势,推进绿色建筑发展第四章 绿色建筑委员会国际合作情况第五章 上海世博会园区生态规划设计的研究与实践第六...
前言第一章 现代设计和现代设计教育现代设计的发展现代设计教育第二章 现代设计的萌芽与“工艺美术”运动工业革命初期的设计发展状况英国“工艺美术”运动第三章 “新艺术”运动“新艺术”运动的背景法国的“新艺...
电厂图书目录
柜号 序号 G1 1 G1 2 G1 3 G2 4 G2 5 G2 6 G2 7 G2 8 G2 9 G1 10 G2 11 G2 12 G2 13 G2 14 G1 15 G1 16 G1 17 G2 18 G2 19 G2 20 G1 21 G3 22 G3 23 G3 24 G3 25 G3 26 G3 27 G1 28 G1 29 G3 30 G3 31 G2 32 G2 33 G2 34 G2 35 G2 36 G2 37 G2 38 下右 39 下右 40 下右 41 下右 42 下右 43 下右 44 下右 45 下右 46 下右 47 下右 48 下右 49 下右 50 下右 51 下右 52 下右 53 下左 54 下左 55 下左 56 下左 57 下左 58 下左 59 下左 60 下左 61 下左 62 下左 63 下左 64 下左 65 下左 66 下左 67 下
工程常用图书目录
1 工程常用图书目录(电气、给排水、暖通、结构、建筑) 序号 图书编号 图书名称 价格(元) 备注 JTJ-工程 -24 2009JSCS-5 全国民用建筑工程设计技术措施-电气 128 JTJ-工程 -25 2009JSCS-3 全国民用建筑工程设计技术措施-给水排水 136 JTJ-工程 -26 2009JSCS-4 全国民用建筑工程设计技术措施-暖通空调 ?动力 98 JTJ-工程 -27 2009JSCS-2 全国民用建筑工程设计技术措施-结构(结构体系) 48 JTJ-工程 -28 2007JSCS-KR 全国民用建筑工程设计技术措施 节能专篇-暖通空调 ?动力 54 JTJ-工程 -29 11G101-1 混凝土结构施工图平面整体表示方法制图规则和构造详图(现浇混凝土框架、剪力墙、框架 -剪力墙、框 支剪力墙结构、现浇混凝土楼面与屋面板) 69 代替 00G101
可测定多层薄膜和基片的折射率、吸收系数和厚度,可全自动、可同时测定透过光谱和反射光谱,入射光角度可从0°到90°连续改变。 2100433B
主要用于评价薄膜等材料在不同的温度范围下吸附性能的评价工作,可实现PRR\TPO\TPD,静态化学吸附,物理吸附等实验能够提供高质量的比表面、孔隙度和化学吸附等温线数据.。 2100433B
光谱分辨率:1nm或2nm (可选);光源:150W 氙弧灯;样品尺寸:10×10mm到200×250mm;层数:至多5层,两个未知参数;薄膜厚度范围:1nm到25um,取决于角度、偏振和波长。