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数据转换器目录

2022/07/13174 作者:佚名
导读:Dedication Preface 1. BACKGROUND ELEMENTS 1.1 The Ideal Data Converter 1.2 Sampling 1.2.1 Undersampling 1.2.2 Sampling-time Jitter 1.3 Amplitude Quantization 1.3.1 Quantization Noise 1.3.2 Properties

Dedication

Preface

1. BACKGROUND ELEMENTS

1.1 The Ideal Data Converter

1.2 Sampling

1.2.1 Undersampling

1.2.2 Sampling-time Jitter

1.3 Amplitude Quantization

1.3.1 Quantization Noise

1.3.2 Properties of the Quantization Noise

1.4 kT/C Noise

1.5 Discrete and Fast Fourier Transforms

1.5.1 Windowing

1.6 Coding Schemes

1.7 The D/A Converter

1.7.1 Ideal Reconstruction

1.7.2 Real Reconstruction

1.8 The Z-Transform

References2. DATA CONVERTERS SPECIFICATIONS

2.1 Type of Converter

2.2 Conditions of Operation

2.3 Converter Specifications

2.3.1 General Features

2.4 Static Specifications

2.5 Dynamic Specifications

2.6 Digital and Switching Specifications

References

3. NYQUIST-RATE D/A CONVERTERS

3.1 Introduction

3.1.1 DAC Applications

3.1.2 Voltage and Current References

3.2 Types of Converters

3.3 Resistor based Architectures

3.3.1 Resistive Divider

3.3.2 X-Y Selection

3.3.3 Settling of the Output Voltage

3.3.4 Segmented Architectures

3.3.5 Effect of the Mismatch

3.3.6 Trimming and Calibration

3.3.7 Digital Potentiometer

3.3.8 R-2R Resistor Ladder DAC

3.3.9 Deglitching

3.4 Capacitor Based Architectures

3.4.1 Capacitive Divider DAC

3.4.2 Capacitive MDAC

3.4.3 "Flip Around" MDAC

3.4.4 Hybrid Capacitive-Resistive DACS

3.5 Current Source based Architectures

3.5.1 Basic Operation

3.5.2 Unity Current Generator

3.5.3 Random Mismatch with Unary Selection

3.5.4 Current Sources Selection

3.5.5 Current Switching and Segmentation

3.5.6 Switching of Current Sources

3.6 Other Architectures

References

4. NYQUIST RATE A/D CONVERTERS

4.1 Introduction

4.2 Timing Accuracy

4.2.1 Metastability error

4.3 Full-Flash Converters

4.3.1 Reference Voltages

4.3.2 Offset of Comparators

4.3.3 Offset Auto-zeroing

4.3.4 Practical Limits

4.4 Sub-Ranging and Two-Step Converters

4.4.1 Accuracy Requirements

4.4.2 Two-step Converter as a Non-linear Process

4.5 Folding and Interpolation

4.5.1 Double Folding

4.5.2 Interpolation

4.5.3 Use of Interpolation in Flash Converters

4.5.4 Use of Interpolation in Folding Architectures

4.5.5 Interpolation for Improving Linearity

4.6 Time-Interleaved Converters

4.6.1 Accuracy requirements

4.7 Successive Approximation Converter

4.7.1 Errors and Error Correction

4.7.2 Charge Redistribution

4.8 Pipeline Converters

4.8.1 Accuracy Requirements

4.8.2 Digital Correction

4.8.3 Dynamic Performances

4.8.4 Sampled-data Residue Generator

4.9 Other Architectures

4.9.1 Cyclic (or Algorithmic) Converter

4.9.2 Integrating Converter

4.9.3 Voltage-to-Frequency Converter

References

5. CIRCUITS FOR DATA CONVERTERS

5.1 Sample-and-Hold

5.2 Diode Bridge S&H

5.2.1 Diode Bridge Imperfections

5.2.2 Improved Diode Bridge

5.3 Switched Emitter Follower

5.3.1 Circuit Implementation

5.3.2 Complementary Bipolar S&H

5.4 Features of S& Hs with BJT

5.5 CMOS Sample-and-Hold

5.5.1 Clock Feed-through

5.5.2 Clock Feed-through Compensation

5.5.3 Two-stages OTA as T&H

5.5.4 Use of the Virtual Ground in CMOS S&H

5.5.5 Noise Analysis

5.6 CMOS Switch with Low Voltage Supply

5.6.1 Switch Bootstrapping

5.7 Folding Amplifiers

5.7.1 Current-Folding

5.7.2 Voltage Folding

5.8 Voltage-to-Current Converter

5.9 Clock Generation

References

6. OVERSAMPLING AND LOW ORDER EA MODULATORS

6.1 Introduction

6.1.1 Delta and Sigma-Delta Modulation

6.2 Noise Shaping

6.3 First Order Modulator

6.3.1 Intuitive Views

6.3.2 Use of 1-bit Quantization

6.4 Second Order Modulator

6.5 Circuit Design Issues

6.5.1 Offset

6.5.2 Finite Op-Amp Gain

6.5.3 Finite Op-Amp Bandwidth

6.5.4 Finite Op-Amp Slew-Rate

6.5.5 ADC Non-ideal Operation

6.5.6 DAC Non-ideal Operation

6.6 Architectural Design Issues

6.6.1 Integrator Dynamic Range

6.6.2 Dynamic Ranges Optimization

6.6.3 Sampled-data Circuit Implementation

6.6.4 Noise Analysis

……

7. HIGH-ORDER, CT EA CONVERTERS AND EA DAC

8. DIGITAL ENHANCEMENT TECHNIQUES

9. TESTING OF D/A AND A/D CONVERTERS

*文章为作者独立观点,不代表造价通立场,除来源是“造价通”外。
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